Memory corruption while handling test pattern generator IOCTL command.
Conclusion & alert: CVE-2024-53017 is rated Low Risk (34.6/100): CVSS Medium severity, with low exploitation likelihood (EPSS 0.08%). Mandatory action: Monitor for updates and reassess as exploit intelligence or EPSS changes.
Risk is dynamic; we continuously reassess and refresh what is shown on this page as upstream context changes.
EPSS lead: Daily EPSS estimates relative likelihood of exploitation; percentile ranks this CVE among scored vulnerabilities (higher = more severe relative rank).
| # | Date | Old EPSS score | New EPSS score | Delta (New - Old) |
|---|---|---|---|---|
| 1 | 2026-03-30 | 0.01% | 0.08% | +0.06% |
| 2 | 2025-06-03 | — | 0.01% | — |
Full EPSS history (2 records total)
CVSS metrics for this CVE.
| Base score | Version | Severity | Vector | Exploitability | Impact | Score source |
|---|---|---|---|---|---|---|
| 6.6 | 3.1 | MEDIUM |
|
1.8 | 4.7 | [email protected] |
| Vendor | Product | Version | Raw CPE |
|---|---|---|---|
| qualcomm | sdm429w_firmware | — | cpe:2.3:o:qualcomm:sdm429w_firmware:-:*:*:*:*:*:*:* |
| qualcomm | snapdragon_429_mobile_platform_firmware | — | cpe:2.3:o:qualcomm:snapdragon_429_mobile_platform_firmware:-:*:*:*:*:*:*:* |
| qualcomm | wcn3620_firmware | — | cpe:2.3:o:qualcomm:wcn3620_firmware:-:*:*:*:*:*:*:* |
| qualcomm | wcn3660b_firmware | — | cpe:2.3:o:qualcomm:wcn3660b_firmware:-:*:*:*:*:*:*:* |
| URL | Tags |
|---|---|
| https://docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulletin.html | Vendor Advisory |