This page lists publicly disclosed CVE vulnerabilities affecting qualcomm qcc5161_firmware (linked via NVD CPE). Each row includes severity scores, summaries, and publication dates to help identify and analyze security issues.
| CVE | Summary | Source | Max CVSS | EPSS % | Published | Updated |
|---|---|---|---|---|---|---|
| CVE-2025-47370 | Transient DOS when a remote device sends an invalid connection request during BT connectable LE scan. | [email protected] | 6.5 | 0.02% | 2025-11-04 | 2025-11-05 |
| CVE-2025-47342 | Transient DOS may occur when multi-profile concurrency arises with QHS enabled. | [email protected] | 7.1 | 0.05% | 2025-10-09 | 2025-10-21 |
| CVE-2025-47318 | Transient DOS while parsing the EPTM test control message to get the test pattern. | [email protected] | 7.5 | 0.05% | 2025-09-24 | 2025-11-28 |
| CVE-2025-47317 | Memory corruption due to global buffer overflow when a test command uses an invalid payload type. | [email protected] | 7.8 | 0.01% | 2025-09-24 | 2025-09-25 |